Dual loop architecture useful for a programmable clock source and clock multiplier applications

ABSTRACT

A first phase-locked loop (PLL) circuit includes an input for receiving a timing reference signal from an oscillator, a controllable oscillator circuit supplying an oscillator output signal, and a multi-modulus feedback divider circuit. A second control loop circuit is selectably coupled through a select circuit to supply a digital control value (M) to the multi-modulus feedback divider circuit of the first loop circuit to thereby control the oscillator output signal. While the second control loop is coupled to supply the control value to the feedback divider circuit, the control value is determined according to a detected difference between the oscillator output signal and a reference signal coupled to the second control loop circuit at a divider circuit. While the second control loop circuit is not coupled to control the first PLL circuit, the first PLL circuit receives a digital control value to control a divide ratio of the feedback divider, the digital control value is determined at least in part according to a stored control value stored in nonvolatile storage, the stored control value corresponding to a desired frequency of the oscillator output signal.

This application is a continuation of U.S. application Ser. No.10/878,218, filed Jun. 28, 2004, entitled, “Dual Loop ArchitectureUseful for a Programmable Clock Source and Clock MultiplierApplications,” naming Axel Thomsen, Yunteng Huang and Jerrell P. Hein asinventors, which is a continuation-in-part of U.S. application Ser. No.10/675,543, filed Sep. 30, 2003, now U.S. Pat. No. 7,187,241, entitled“Calibration of Oscillator Devices,” naming Jerrell Hein and AxelThomsen as inventors, which claimed benefit under 35 U.S.C. § 119(e) ofU.S. Provisional Application No. 60/467,813, filed May 2, 2003,entitled, “Multi-Functional Output Enable Terminal,” naming Jerrell P.Hein and Axel Thomsen as inventors; and U.S. application Ser. No.10/878,218 claims benefit under 35 U.S.C. 119(e) of U.S. ProvisionalApplication No. 60/567,479, filed May 3, 2004, entitled “Method andApparatus for a Programmable Clock Source Generating a Wide Range ofOutput Frequencies,” naming Axel Thomsen, Yunteng Huang, Jerrell P. Heinas inventors, all of which patents and applications are incorporatedherein by reference.

BACKGROUND

1. Field of the Invention

This application relates to integrated circuit devices more particularlyto integrated circuits utilized in generating clock signals.

2. Description of the Related Art

Clock sources typically utilize a resonator such as a crystal oscillatoror surface acoustic wave (SAW) device. Precision in traditional clocksources utilizing crystal oscillators is determined by the accuracy ofthe cut of the crystal and the calibration performed after the cut. Forexample, frequency tuning may be achieved by sputtering gold aftercutting the crystal. Fixed frequency sources such as crystals havetypically provided better phase noise performance than the phase noiseperformance associated with a variable frequency source such as, e.g., avoltage controlled oscillator (VCO). That is due, at least in part, tothe fact that the variable elements (e.g., the varactor) associated withthe VCO used to vary the frequency have higher losses than fixedelements such as the capacitors in a fixed source.

However, resonators typically have a limited optimum range due tomanufacturing constraints. That is, it is hard to pull a crystal over awide range. However, various applications have requirements for numerousfrequencies outside the easy range for a resonator. Typically, adifferent frequency range will require a different resonator. Accuracyrequirements vary for clock sources, but are typically in the parts permillion (ppm) range.

In another aspect, clock signals are used by transmission systems tosynchronize the flow of data. Such clock signals, particularly highspeed clock signals, may include jitter, which should be managed toprevent bit errors. Jitter is the variation in clock output frequencyfrom a desired output frequency and can occur for a number of reasons.Jitter may be caused by noise introduced into the system from any of avariety of sources including jitter present on a reference clockutilized in generating the high speed clock signals. It would bedesirable to provide improved techniques for supplying high speed clocksignals.

It would also be desirable to provide a clock source that meets accuracyrequirements, allows the use of a resonator that is easy to manufactureand low cost, but can still provide a wide range of output frequenciesand suitable phase noise performance.

SUMMARY

In one embodiment, an apparatus is provided that includes a firstphase-locked loop (PLL) circuit that has an input for receiving a timingreference signal, a controllable oscillator circuit supplying anoscillator output signal, and a multi-modulus feedback divider circuit.A second control loop circuit is selectably coupled to supply a controlvalue to the multi-modulus feedback divider circuit of the first loopcircuit to thereby control the oscillator output signal. The controlvalue supplied may be a digital control value. In an embodiment, whilethe second control loop is coupled to supply the control value to thefeedback divider circuit, the control value is determined according to adetected difference between the oscillator output signal and a referencesignal coupled to the second control loop circuit. In an embodiment, atemperature compensation circuit is coupled to supply an adjustmentvalue according to a detected temperature, and the control valuesupplied to the multi-modulus feedback divider circuit is adjustedaccording to the adjustment value, while the second control loop is notcoupled to supply the control value to the feedback divider circuit. Theapparatus may further include a voltage control input, and the controlvalue supplied to the multi-modulus feedback divider circuit is adjustedaccording to a voltage value present on the voltage control input. Theapparatus may further include one of a crystal oscillator and a surfaceacoustic wave (SAW) resonator supplying the timing reference signal. Thesecond control loop circuit may be implemented as a phase-locked loopand include a digital loop filter. The apparatus may further include anonvolatile storage; and while the second control loop circuit is notcoupled to control the first PLL circuit, the first PLL circuit receivesa digital control value to control a divide ratio of the feedbackdivider, the digital control value being determined at least in partaccording to a stored control value stored in the nonvolatile storage,the stored control value corresponding to a desired frequency of theoscillator output signal. The stored control value in the non-volatilestorage may be based on a digital control value that was stored as aresult of the second control loop circuit detecting a lock conditionindicating that the oscillator output signal was locked to a referencesignal coupled to the second control loop circuit. In an embodiment thesecond control loop is implemented as a low bandwidth phase-locked loopand a bandwidth of the first PLL circuit is substantially higher thanthe low bandwidth of the second control loop circuit.

In another embodiment, a method is provided that includes selectablycoupling an outer loop circuit to control an inner loop circuit; andcontrolling the inner loop circuit by supplying a control value from theouter loop circuit to control a divide ratio of a feedback divider ofthe inner loop circuit, while the outer loop is coupled to control theinner loop, to cause the inner loop to generate an output signal basedon a reference clock signal supplied to the outer loop circuit. Themethod may further include supplying the inner loop with a timingreference signal from one of a crystal oscillator and a surface acousticwave (SAW) device as an input into the inner loop circuit. In anembodiment, the inner loop circuit is a fractional N loop such that aperiod of the timing reference signal can be a non-integer multiple of aperiod of an output signal generated by the inner loop circuit. In anembodiment, the inner loop circuit and outer loop circuit arephase-locked loops and the outer loop is a low bandwidth phase-lockedloop and the inner loop is a phase-locked loop having a substantiallyhigher bandwidth than the low bandwidth of the outer loop circuit. Themethod may further include supplying a stream of integers from a deltasigma modulator corresponding to the control value to control the divideratio of the feedback divider. The method may further include, while theouter loop is not coupled to control the inner loop circuit, supplyingthe inner loop circuit with a digital control signal as the controlvalue to control the divide ratio, the control value being determined atleast in part according to a stored control value stored in anonvolatile storage, the stored control value corresponding to a desiredoutput frequency of the inner loop circuit. The method may furtherinclude determining the digital control value supplied to the inner loopcircuit to control the divide ratio at least in part according to adetected temperature. The method may further include determining thedigital control value supplied to the inner loop circuit to control thedivide ratio at least in part according to a control voltage supplied ona voltage control input terminal to adjust output frequency of the innerloop circuit. The method may further include storing a control signalcorresponding to the divide ratio supplied to the inner loop to causethe inner loop to generate the output signal having a frequencycorresponding to the reference clock, in response to a lock conditiondetected by the outer loop circuit. The method may further includeselecting a source for the control value from one of the outer loopcircuit or from a nonvolatile storage storing a stored control valuecorresponding to desired frequency of the oscillator output signal.

In another embodiment an apparatus is provided that includes afractional N inner loop circuit including, an input for receiving atiming reference signal, a feedback divider circuit, and a controllableoscillator circuit. An outer loop circuit is coupled to compare afeedback signal coupled to an output of the oscillator circuit and areference signal coupled to an input of the outer loop circuit, andgenerates an error signal indicative of the comparison. The outer loopis coupled to supply a divider control signal to control a divide ratioof the feedback divider circuit, the divider control signal beingdetermined at least in part according to the error signal generated bythe outer loop circuit.

In another embodiment, a method is provided for receiving a firstreference signal as an input to a fractional-N phase-locked loop circuit(PLL), generating an error signal in a second phase-locked loopindicative of a difference between a feedback signal coupled to anoutput of the fractional-N PLL and a second reference signal coupled toan input of the second phase-locked loop, and supplying a controlsignal, based at least in part on the error signal, to control a dividercircuit in a feedback path of the inner loop circuit.

In another embodiment, an integrated circuit is provided that includes afirst phase-locked loop (PLL) circuit including an input for receiving atiming reference signal, a controllable oscillator circuit supplying anoscillator output signal, and a feedback divider circuit. A secondcontrol loop circuit supplies a control value to the feedback dividercircuit to thereby control the oscillator output signal.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention may be better understood, and its numerousobjects, features, and advantages made apparent to those skilled in theart by referencing the accompanying drawings.

FIG. 1 illustrates a device in which an integrated circuit and a crystalare packaged in a standard six pin VCXO ceramic package.

FIG. 2 illustrates a device in which an integrated circuit and a crystalare packaged in a standard four pin XO ceramic package.

FIG. 3 illustrates a block diagram of an exemplary integrated circuitsuitable for use as the integrated circuit in FIG. 1 or 2.

FIG. 4 illustrates alternative serial communication terminals forprogramming and for receiving a configuration clock according to anembodiment of the invention.

FIG. 5 illustrates exemplary read and write formats utilized forcommunicating over a serial port.

FIG. 6 illustrates exemplary use of Manchester encoding for datasupplied over the serial port.

FIG. 7 illustrates exemplary use of a calibration clock over the serialport.

FIG. 8 illustrates an exemplary embodiment of the digitally controlledoscillator utilized in FIGS. 3 and 4.

FIG. 9 illustrates a block diagram of an exemplary phase selectabledivider circuit that may be utilized in the multi-modulus divider inFIG. 8.

FIG. 10 illustrates operation of the phase selectable divider of FIG. 9.

FIG. 11 illustrates an exemplary implementation of a multi-modulusdivider.

FIG. 12 illustrates operation of the multi-modulus divider shown in FIG.11.

FIG. 13 illustrates the additional details of an embodiment of the deltasigma modulator and phase error cancellation (PEC) circuit shown in FIG.8.

FIG. 14 illustrates a block diagram of a clock multiplier embodimentutilizing the dual loop architecture described in FIG. 8.

The use of the same reference symbols in different drawings indicatessimilar or identical items.

DESCRIPTION OF THE PREFERRED EMBODIMENT(S)

Referring to FIG. 1, a high level diagram shows a clock source devicethat includes an integrated circuit 10 coupled to a crystal 11. In oneembodiment both the integrated circuit 10 and the crystal 11 arepackaged in a standard ceramic package 15 that is typically utilized forpackaging a voltage controlled crystal oscillator (VCXO). Note thatanother resonating device such as a surface acoustic wave (SAW)resonator may be utilized in place of crystal 11. In the illustratedembodiment, the package 15 includes standard input/output signalsincluding a voltage control input 17, a power and ground input, 19 and21, respectively, differential clock outputs and an output enable (OE)pin 27. FIG. 2 illustrates a four pin XO package implementation in whichthe control voltage input 17 is not utilized and the output clock 29 issingle ended. A six pin XO package configuration may also be utilized inwhich the control voltage input on the package is not connected when thepackage 15 is mounted to a board. Other packaging alternatives for theintegrated circuit with or without the crystal oscillator or SAW mayalso be utilized.

Referring to FIG. 3, a block diagram illustrates an embodiment ofintegrated circuit 10 that provides a fixed frequency or voltagecontrolled clock source. In FIG. 3, the integrated circuit is packagedin a six pin VCXO package. Integrated circuit 300 includes a digitallycontrolled oscillator (DCO) 301. With the use of a fractional Nphase-locked loop (PLL), a crystal based reference clock 303 can bemultiplied up by a rational number to supply a wide variety of outputfrequencies. The fractional N loop can be viewed as a digitallycontrolled oscillator, where the output frequency is controlled by therational digital number M according to Fout=M×Fref. Thus, the DCO 301can be implemented as a fractional N PLL providing a wide range ofoutput frequencies f_(osc)=M×f_(x), where f_(x) is supplied fromoscillator 303. The precision of M can be to the level of a few partsper billion. An important criteria is to ensure that a DCO, such asillustrated in FIG. 3, meets the phase noise specifications typicallyachieved by a fixed frequency crystal or SAW based oscillator. Astandard of interest would be for example the SONET standard for jittergeneration. That will be explained in more detail below.

Fractional N phase-locked loops (PLLs) allow the multiplication of anincoming reference clock by a rational rather than an integer number asis common in traditional PLL designs. Such a multiplication requires theuse of a multi-modulus divider in the feedback path. Such a divider willdivide not by a fixed integer, but by a sequence of integers that overtime approximates the rational number desired. This sequence can begenerated by a digital delta sigma modulator which shapes thequantization noise added to the rational number with a high pass filter.Thus the resulting phase noise is also shaped by a high pass filter. Theoverall noise contribution from the fractional PLL depends on two majorfactors. The first major factor is the ratio of the update rate of thePLL (generally the reference clock rate) and the loop bandwidth of thePLL, a measure similar to the oversampling ratio (OSR) in delta sigmaanalog to digital converters (ADCs). A higher OSR allows for bettersuppression of quantization noise in the band of interest. For a givenupdate rate the noise contribution can be reduced by lowering the loopbandwidth. The second major factor contributing to noise is thequantization error applied at the divider, which is the clock period ofthe clock feeding the multi-modulus divider.

Additional to the noise sources stated above, noise in a PLL has 2 othermain contributors: The first other main contributor is noise from thevoltage controlled oscillator (VCO). An integrated LC VCO exhibits 3noise regions, close in 1/f³, intermediate 1/f², and high frequencywhite noise that is frequency independent. For example, exemplarycorners defining the three regions are at 100 KHz and 100 MHz. For anintegrated LC VCO oscillating in the GHz range, the 1/f³ region issignificant, whereas the white noise region is insignificant. Whenembedded in a PLL the noise transfer function to the output of the PLLis a high pass filter with a corner at the loop bandwidth. Wider loopbandwidth improves the noise contribution from the VCO. If the bandwidthof the loop exceeds the 1/f corner of the oscillator, the overall phasenoise performance tends to be very competitive with the performance ofprior art fixed frequency crystal or SAW based oscillators inapplications such as SONET.

The second other main contributor to noise in a PLL is noise from thereference clock. Similar noise regions exist as above. If this clock isgenerated from a fixed crystal oscillator, it is generally verycompetitive at low frequency (1/f³ and 1/f²) but with a significantwhite noise contribution. Narrower loop bandwidth improves the noisecontribution of this source.

The choice of loop bandwidth is an optimization to reduce noise fromvarious sources. Given today's state of the art in LC oscillator designin terms of phase noise and oscillation frequency, and the ability of astate of the art CMOS process to implement a high speed multi-modulusdivider and a high speed delta sigma modulator, it is now possible tooptimize the noise budget to yield a clock source that can exceedstandards such as SONET and to enable this architecture as a clocksource.

Good jitter performance of the DCO loop is facilitated by implementationof the loop filter as a digital filter, which is a technique that allowsan accurate implementation of the loop filter that is properly matchedto the corners and the order of the noise shaping function and thereforecan best reduce the jitter contribution from that source. Digital loopfilter implementations are known in the art and described, e.g., in U.S.Pat. No. 6,630,868, entitled “Digitally Synthesized Loop Filter CircuitParticularly Useful for a Phase Locked Loop,” published as PublishedApplication Number 20020089356 A1, Jul. 11, 2002, naming Perrott et al.as inventors, which are incorporated herein by reference.

Additionally, the current phase error can be computed as the integral ofall instantaneous frequency errors as they were computed in the deltasigma modulator that controls the multi modulus divider. Throughsubtraction in the analog or digital domain, the phase error can becancelled and thus strongly reduced as a noise source. As a result thebandwidth can be increased and thus overall better jitter performancecan be achieved.

The device illustrated in FIG. 3 can function as a voltage-controlledcrystal oscillator (VCXO/VCSO) or as a fixed-frequency clock source(XO/SO). A register bit setting may be used to select between the modesof operation. In voltage-controlled oscillator operational mode acontrol voltage is received on the VC analog voltage input port 309. Theon-chip analog to digital converter (ADC) 311 converts the controlvoltage VC into a digital control word (VCADC) supplied to summingcircuit 315, which generates the control signal M for the DCO 301. Whenoperating in VCXO/VCSO mode, the selector circuit 319 selects input B,which is coupled to the reference frequency (RFREQ) control value storedin a portion 349 of non-volatile storage 317. The control value from theselector circuit may be summed in summing circuit 315 with a temperaturecompensation value (DELMT) supplied on node 321 as described furtherherein, as well as with the control VCADC, and the sum is supplied toDCO 301 as the control signal to determine the DCO output. In VCXO/VCSOmode the RFREQ provides a center frequency that is adjusted by VCADC. Iftemperature compensation is not used, a value for DELMT is selected soas to not affect the output of DCO 301. Note that while 315 is shown inthe block diagram as a summing circuit, some embodiments may utilizeother arithmetic circuits to appropriately combine the various controlvalues that are used to form the control signal M for DCO 301. Forexample in one embodiment, the signals are combined using a multipliercircuit in which the center frequency provided by RFREQ is scaledappropriately by VCADC and/or DELMT using a multiplier circuit.

When operating as a fixed frequency clock source, the selector circuit319 also selects input B, to supply the reference frequency (RFREQ)control value stored in a portion 349 of non-volatile storage 317. Thatcontrol value may be summed in summing circuit 315 with a temperaturecompensation value (DELMT) supplied on node 321. The sum from summingcircuit 315 is supplied to DCO 301 as the control signal to determinethe DCO output. When operating as a fixed-frequency clock source(XO/SO), the ADC 311 may be powered down and its output fixed to itsmid-scale value so as not to affect the DCO 301.

The use of a DCO as a clock source has several advantages. Digitalcontrol of the output frequency allows for storage of calibrationparameters in non-volatile memory 317. Also, the DCO can be embedded inan outer phase locked loop as described further herein. This outer loopincludes a phase detector with digital output and a digital loop filter337 and the DCO 301. When the outer loop is in lock to a referencefrequency, the value present at the input to the DCO 301 is the propermultiplier to achieve this frequency in an open loop operation.Therefore this value can be stored while in lock and recalled later foroperation in open loop as a clock source. The loop bandwidth of theinner loop, as described above, is preferably greater than the 1/fcorner. Depending on specific implementations, the loop bandwidth of theinner loop may range from approximately 10 KHz to approximately 10 MHz.The loop bandwidth of the outer loop is preferably substantially lower,e.g., below approximately 1 KHz and may be less than or equal to 50 Hz.Note also that the inner loop is implemented to adjust quickly tochanges as compared with the outer loop. Having a low outer loopbandwidth allows attenuation of jitter present on the reference clockinput to the outer loop, which in turn can reduce jitter present in astored control value to control the output of the inner loop.

The embodiment illustrated in FIG. 3 has the capability of generatingand storing a digital control value for DCO 301 corresponding to acalibration clock signal received via a calibration input. As discussed,above, when the outer loop is in lock to a reference frequency used forcalibration, the value present at the input to the DCO 301 is the propermultiplier to achieve this frequency in an open loop operation.Therefore this value can be stored while in lock and recalled later foroperation in open loop as a clock source. In that way, the device can beprogrammed to provide a clock having a desired output frequency. Whenoperating in calibration mode, as described further herein, acalibration clock signal is supplied, e.g., on terminal 331 and viasignal line 333 to divider 335. The calibration clock is compared to theoutput of the DCO 301 in phase and frequency detector 337 and an errorsignal is generated and filtered and supplied to adjust the output ofDCO 301. When the output of the DCO has locked to the suppliedcalibration clock, the value of M may be stored. The calibration clockfeature is useful, e.g., so that the device can lock its output clock tothe calibration clock using an internal PLL, and control factors used tolock the PLL to the calibration clock can be stored for absolute outputfrequency and/or frequency versus temperature, as described furtherbelow. That stored value may then be utilized to control the DCO duringnormal operation.

In order to supply the calibration clock and perform necessaryprogramming associated with configuring the clock source, acommunication port, e.g., a serial port may be provided. The serial portmay be provided as a dedicated programming port or its function can becombined with other I/O terminals. For example, in one embodiment, theOE pin 331 functions as a normal output enable and for programming andcalibrating the device 300. In order to program the integrated circuitdevice, the OE terminal 331 is used to communicate serial data to andfrom the integrated circuit 300 and used to supply a calibration clock.FIG. 3 shows an embodiment where the OE pin is also used as thecommunications port. Referring to FIG. 4, in another embodiment theoption is provided for using one of two dedicated I/Os on the integratedcircuit device. The P1 port 401 is a dedicated I/O that functions as abidirectional serial port for register data reads and writes, and as acalibration clock input, similar to the function of the OE pin used forprogramming and calibration described above but without any OE pinfunctionality. The P2 port 403 is also a dedicated I/O with the sameserial bus and calibration clock functionality as P1; however, onceprogramming is completed, P2 can be converted from a dedicated serialport I/O to an input control for the output enable function. In stillother embodiments, the voltage control input 309 may be used as a serialcommunications port. In order to distinguish between calibration clocksand serial data, a serial data command may be utilized that indicates tothe device that the calibration clock will be applied next. That commandenables the calibration PLL. After this command, the user supplies acalibration clock to the appropriate terminal providing the serial port.The frequency of the calibration clock may be low even though the outputfrequencies are high due to the use of the divider 347 in the feedbackpath from the oscillator 301. Additional details on implementation ofthe serial port may be found in application Ser. No. 10/675,543, filedSep. 30, 2003, now U.S. Pat. No. 7,187,241, entitled “CALIBRATION OFOSCILLATOR DEVICES.”

The serial port is typically used during manufacture test to establishthe desired device configuration in the on-chip non-volatile memory(NVM) 317. Serial port communications can begin following apower-on-reset of the device. An exemplary command format for the serialbus is shown in FIG. 5. Each transmission has three eight bit bytes ofdata: the preamble byte 501, the instruction byte 503, and theaddress/data byte 505. One extra clock cycle 507 exists for the Readcommand in order to allow time for placing the transmit output of thetest equipment hooked up to the device in high impedance before thefirst read bit is sent by the device. The serial port state machine,returns to its initialized condition if any invalid input data isdetected or if no activity occurs on the bus. That feature allows thestate machine to be brought to a known condition before signalingbegins. In one embodiment, all data sent from the test equipment(master) to the device (slave) is Manchester encoded with a symbol rateof approximately 10 kbps. The Manchester encoding creates guaranteedtransitions in the data pattern that are used by the device to determinethe master's transmission rate. In an embodiment, read data sent fromthe device to the test equipment is in a non-return to zero (NRZ)format, which maximizes the available sampling time for the testequipment master. The test equipment master can sample the read datausing the same internal clock used to generate the transmit data.

FIG. 6 gives illustrates a Manchester encoded “0” and “1” and also showsthe required preamble data pattern. Note that the preamble containsmultiple Manchester code violations in order to increase its uniquenessand reduce the chances of false preamble detection.

Referring again to the embodiment illustrated in FIG. 3, thedigitally-controlled oscillator (DCO) 301 is driven by a digitalfrequency control word M and produces a low jitter output clock. Thecontrol word M supplied to the DCO 301 is generated by summing (ormultiplying as mentioned above) a reference frequency control word(RFREQ) with the VCO ADC 311 output (VCADC), if utilized, and thetemperature compensation value (DELMT), if utilized in summer 315. Thefixed frequency external crystal 303, SAW, or other source, provides alow jitter reference needed to synthesize the output clock. In oneembodiment frequency synthesis is done digitally, eliminating sensitivenoise entry points.

In one embodiment, the method for frequency and temperature calibrationof the DCO uses an external calibration clock applied at the serialport. In calibration mode, a digital phase locked loop (PLL) isimplemented around the DCO, locking the DCO output clock to an integermultiple of the low frequency input calibration clock. Once thecalibration clock is applied, the device internally generates therequired calibration correction factors to generate the desired outputfrequency.

With reference to FIGS. 3 and 4, calibration according to an embodimentof the invention operates as follows. First the temperature compensationDELMT (delta M over temperature) is turned off. That forces itscontribution to summing circuit 315 to 0. If desired it may be enabledafter the calibration is complete. If the device is being used as a VCO,VCO mode should be enabled and the analog input V_(C) 309 should be setto its mid-scale voltage during the calibration. That sets the analog todigital converter 311 at midrange. If the device is being used as afixed frequency oscillator, VCO mode should be disabled to cause theoutput of the ADC 311 to be at midscale and thus not affect the outputfrequency. Next the calibration clock frequency range should be selectedby selecting the N3 divider value for divider 335. In one embodiment,there are two possible frequency ranges for the calibration clock. Aregister bit can be used to select the range from 1 to 2 MHz, (thedivider value=1). To select the range from 8 to 16 MHz, the inputdivider N3 is set to a divider value to 8. The choice of calibrationclock frequency range is based on the availability of precision clocksources in the manufacturing test environment. Other embodiments mayhave different values for the divider block N3 or lack the divider blockentirely.

The values for dividers 335 (N3), 347 (N2), and 346 (N1), and the highspeed divider (HS_DIV) (see FIG. 8) should be selected along with thecalibration clock frequency. The equation relating the calibration clockfrequency to the output frequency is as follows for one embodiment ofthe invention:

f _(OUT) =f _(CALCK) ×N2/(HS _(—) DIV×N1) (for N3=1), or

f _(OUT) =f _(CALCK) ×N2/(8×HS _(—) DIV×N1) (for N3=8),

where HS_DIV=[4, 5, 6, 7, 9, 11], 1≦N1≦2⁷ and N2=256, 512, 1024Other embodiments may provide other divider values, additional or fewerdividers and thus have different equations for determining the outputfrequency.

In some embodiments, the calibration loop bandwidth is also selectable.In one embodiment two choices for calibration loop bandwidth areavailable, which are selected according to a register bit. The widerbandwidth provides faster settling time, but allows more of thecalibration clock phase noise to affect the absolute frequency accuracywhen the DCO control is frozen. The lower bandwidth has slower settling,but less variation in the absolute frequency value when the DCO controlis frozen. The optimal choice is a function of the calibration clockjitter and the absolute frequency accuracy requirement for theapplication.

Referring to FIG. 7, and FIGS. 3 and 4, the control circuit 341 thenreceives a command setting the calibration clock on (CCK_ON) registerbit to one through a serial port register write, indicating that acalibration clock is to be supplied over the serial port (input/outputterminal 27, P1, or P2). Subsequently, the calibration clock can besupplied as an input frequency reference for the calibration PLL. FIG. 7illustrates a command sequence including a preamble, write command anddata followed by application of the calibration clock. In response tothe write command, the control state machine selects multiplexer input Afrom the digital phase detector and loop filter 337, which forms aphase-locked loop with DCO 301 in this configuration. The calibrationclock (CALCK) is supplied via node 333 to the divider circuit 335. Thedigital phase detector and loop filter 337 detects the phase/frequencydifference between the calibration clock and the output of the DCO 301and provides a correction signal to summer 315 through multiplexer 319to adjust the control signal M supplied to the DCO 301 to reflect thatdifference. The calibration clock is applied for sufficient amount oftime to allow the PLL to settle and establish the control factors neededto lock the DCO 301 output clock to an integer multiple of the lowfrequency input calibration clock. In other embodiments the DCO may lockto a fractional multiple (e.g., a ratio of integers) of the calibrationclock according to the dividers utilized. Note that because of thedivider 347 in the feedback path of the PLL, the calibration clock canbe a low frequency signal even for those devices with high speed outputclocks. Note that control operations associated with calibration, e.g.,selecting the multiplexer input and storing the value of M, may becontrolled via commands sent to serial port, the result of internalcontrol generated by, e.g., a state machine in control circuit 341, orboth.

Once the PLL is locked and settled the calibration clock is stopped asshown in FIG. 7. That causes the internal state of the device to bestored and the CCK_ON bit is automatically reset to zero. The cessationof the clock is detected by the control circuit 341 causing it to freezethe correction or control values internally. If the delay required todetect the cessation of the clock allows the PLL to be disturbed beforethe control values are stored, a history of the control values can bekept on-chip and the control values that existed before the actual clockcessation can be kept. The values that are stored may be the correctionfactor generated by the phase detector and loop filter 337 or the valueof M when the PLL is locked to the calibration clock (essentially thesame as the correction factor but after the summing circuit 315). Toavoid any inaccuracies in the frozen register values due to the loss ofclock detection delay, a running history of the values is kept and thevalues that existed immediately before the loss of clock are stored whenthe PLL is frozen. The running history may be stored in registers in thecontrol circuit 341. The control value(s), along with appropriatedivider values, can be stored in the non-volatile memory 317, which may,e.g., be implemented as an EPROM, EEPROM, or any other suitablenon-volatile memory. The stored control value is used to generate thecontrol value supplied to the DCO 301 by supplying the control value tosumming node 315 during normal operation.

In one embodiment a lock detection mechanism is included for thecalibration PLL. A lock detect bit (LOCK) is the result of an analysisof the PLL phase detector output. A retriggerable one-shot is set eachtime the phase detector output indicates a full-scale condition (phasecycle slip). The retrigger time of the one-shot may be programmable viaa register bit. Therefore, if no cycle slip has occurred for theretrigger time, the internal lock detection indicator bit (LOCK) is setto one, indicating that the PLL is in lock. The internal lock detectionindicator bit (LOCK) can be queried to verify that the PLL achieved lockduring the time the calibration clock was active.

Once the calibration clock has ceased for a sufficient amount of timedefined by a predetermined time period, the internal over sampling statemachine returns to its reset or initialization state, waiting forfurther activity on OE, P1 or P2, and ready to receive additionalcommands. This timeout feature prevents lockup of the state machine,guaranteeing a known starting condition for the user.

Note that the serial communication capability available throughinput/output terminal 331 also allows a user to program a fixed controlvalue to set oscillator 301 to a specific output frequency by writing toreference frequency storage location 349, supplying that value to themultiplexer 319 and selecting the B input of the multiplexer 319 to besupplied to the summing circuit 315. Additionally, in some embodiments,the divider ratios in some or all of divider blocks may be writtenand/or read via the serial port provided by input/output terminal.

Note that calibration can also be performed without a calibration clockinput. However, that requires multiple serial data writes to the deviceto set the digital control value supplied, e.g., through summing circuit315 so that while the control voltage Vc is centered, the clock outsignal matches the desired output clock frequency. By instead using acalibration clock supplied over the serial port, the device can itselffind the desired correction value by locking its PLL to the calibrationclock.

The on-chip nonvolatile memory (NVM) 317 provides for permanent storageof device configuration settings and calibration settings atmanufacture. The NVM memory space includes bits for all of the settingsnecessary to fully configure the device. The volatile memory spaceincludes duplicate bits for each NVM bit, plus additional bits that donot require nonvolatile storage. In one embodiment, the non-volatilememory is one time programmable. A primary (M1) and secondary (M2) NVMspace may be provided to allow the NVM settings to be written twiceduring the lifetime of the device. A status register may be used toindicate the current status of M1 and M2. Data is written from volatilememory, such as registers, into NVM using the STORE command. Allvolatile memory bits with duplicates in the NVM space are written withone command. The first time the STORE command is executed, the M1 NVMspace is written. When the write is initiated, a status bit (M1_WR) ispermanently set. Once the write is completed, STORE is reset to zero, aread of M1 is done, and the result is compared to the volatile memorysettings. If there is a match, then the NVM write has been successfuland the M1_CHK status bit is permanently set. The next time the STOREcommand is executed, the M2 NVM space will be written. After devicepowerup or reset, the NVM status bits are checked and the appropriateNVM memory space downloaded into the volatile memory. The appropriateNVM space may also be downloaded on command using the RECALL registerbit. Once the download is complete, RECALL is reset automatically.

Upon power up, the device internally executes a power on-reset (POR)which resets the internal device logic, loads the various settingsstored in the non-volatile memory into volatile memory (e.g., thevarious control registers), and places the device output into highimpedance. A register bit may also be used to initiate a reset.

In one embodiment, the center frequency of the device is determined bythe reference frequency (RFREQ) supplied to the DCO as control input Mand the HS_DIV (see FIG. 8) and N1 output divider values. In oneembodiment the device has the capability of storing four unique sets ofRFREQ, HS_DIV, and N1 values representing four unique selectable outputfrequencies. There need not be a relationship between the fourfrequencies desired. That feature is useful in applications where adifferent output frequency is required depending on the systemconfiguration. The FRQSEL[1:0] inputs 407 (FIG. 4) select which set ofRFREQ, HS_DIV, and N1 values are used. If this feature is not desired,the FRQSEL[1:0] pins can be left floating, in which case default valuesare selected.

Note that the devices illustrated in FIGS. 3 and 4 can providetemperature compensation. That compensation is achieved by supplying theappropriate compensation value from non-volatile memory 317 based on thetemperature detected by thermometer 351. Calibration for temperaturecompensation involves generating digital correction factors for varioustemperatures of interest.

In one embodiment temperature compensation values are determined asfollows. First a reference temperature point is determined. Thecalibration at this temperature sets the RFREQ value to the DCO and allother temperature/frequency points are calculated with respect to thisreference point. The reference temperature does not have to be thenominal ambient temperature of operation. To establish the referencetemperature calibration point, a temperature calibration point register(TCP[2:0]) is set to 000, FRQSEL[1:0]=11 (if that feature is provided),and the device is brought to the desired reference temperature. Thecalibration clock is then applied through the serial port. When theclock is stopped, the M value corresponding to the frozen frequency andthe temperature value are stored in the RFREQ_(—)11 and RTEMP RAMregisters, respectively. The stored values of M and the temperature arethe values that existed immediately before the clock was stopped toavoid any glitches that might occur after the calibration clock isstopped.

To generate the calibration points across temperature, afterestablishing the reference temperature calibration point, TCP[2:0] isset to 001 to indicate the next temperature calibration point is beingestablished, and FRQSEL[1:0] is set to 11, and the device is brought tothe desired temperature. The calibration clock is applied as describedpreviously. When the clock is stopped, the frozen delta-frequency value(relative to RFREQ_11) is stored in a DELMT1 register. The frozendelta-frequency value=(M at the reference temperature)−(M at the nexttemperature calibration point). The associated temperature is stored inthe TEMP1 register. For each additional temperature calibration point,the temperature calibration point register is incremented and thecalibration clock is reapplied at the desired temperature, and the newfrozen delta-frequency value is stored along with the correspondingtemperature. The temperature and delta M values are subsequently storedin non-volatile memory. During operation the M value at the referencetemperature is used when the thermometer 351 indicates the referencetemperature and appropriate offsets (supplied as DELMT) are suppliedaccording to the temperature detected by thermometer 351. In otherembodiments, the value of M at the particular temperature is stored,rather than delta M, and that value is supplied for temperaturecompensation.

In one embodiment the device can store up to six calibration points(frequency and temperature pairs), including the reference point, tocalibrate the device across temperature. In normal operation with thetemperature compensation feature turned on, the device interpolatesbetween the provided calibration points using a polynomial of order N−1,where N is the umber of calibration points to be used, which in oneembodiment is programmable using register bits. For example, if valuesare written into RFREQ_11, DELMT1, DELMT2, and DELMT3 while DELMT4 andDELMT5 are not to be used, the user set N=4 so that a 3rd orderpolynomial interpolation is used.

As illustrated in FIG. 4, and described above a multi-frequency featureis available using the frequency select inputs FREQSEL[1:0]. If themulti-frequency feature is used, establishing the correct M value forthe additional frequencies is achieved by holding the device at thereference temperature, setting FREQSEL[1:0]=10, and reapplying thecalibration clock at the appropriate frequency. When the clock isstopped, the frozen frequency control value is stored in RFREQ_10. If athird and fourth frequency are desired, repeat the above procedure withFRQSEL[1:0]=01 and 00, respectively.

In order to additionally compensate for temperature variations, whichaffect the reference frequency supplied, e.g., by the XO, the delta Mover T value (DELMT) value is supplied to summing circuit 315 along withthe reference frequency control value RFREQ. Thus, the control valuegenerated at the reference temperature calibration point, along with aninterpolated delta as described above, is supplied to summer 315 andutilized to generate the M value. Note that other temperaturecalibration algorithms besides the interpolation described above may beutilized. That function, in the embodiment illustrated in FIG. 4, isperformed by the control circuit 341.

Referring to FIG. 8, illustrated is an exemplary embodiment of thedigitally controlled oscillator (DCO) 301. The crystal (or SAW)oscillator 303 supplies a timing reference to the DCO 301 as one inputto the phase and frequency detector 801. Phase and frequency detector801 generates an error term of the difference between the crystaloscillator input and the feedback from the VCO 805. Note that thefeedback is supplied by multi-modulus divider block 807. Duringcalibration, the DCO 301 functions as an inner loop having its feedbackdivider controlled by an outer loop that includes the dividers 335, 347,phase detector and analog to digital converter 853, filter 851, deltasigma modulator 809 as well as portions of the inner loop. The innerloop or DCO 301 is a fractional N loop wherein a period of the referenceclock supplied by crystal or SAW 303 may be a non-integer multiple of aperiod of the oscillator clock signal supplied by VCO 805. Using afractional N loop allows the use of low cost timing reference such as alow cost crystal oscillator. During normal operation, the DCO receives acontrol value from summing circuit 315 based on VCADC (from ADC 311(FIG. 3)), DELMT, and RFREQ. Thus, the temperature compensation isachieved by adjusting the feedback loop of the DCO 301 through the deltasigma modulator 809, which is coupled to adjust the divider valuesupplied to the divide block 807.

Note that the inner loop forming DCO 301 utilizes a digital loop filterto allow the loop filter to be integrated onto the integrated circuit toreduce potential additional noise sources. Further, as described above,utilization of a digital loop filter allows an accurate implementationof the loop filter that is properly matched to the corners and the orderof the noise shaping function and therefore can best reduce the jittercontribution from that source.

In one embodiment, the multi-modulus divider 807 is formed by a seriesof dividers. Because the feedback frequency may be in the GHz range, aprescalar is used to divide the feedback signal by, e.g., 4 or 5.Subsequent division stages, e.g., a plurality of divide by 4 and/or 5stages further divide the feedback signal to an appropriate valueaccording to the desired divider value.

Referring to FIG. 9 a block diagram of an exemplary phase selectabledivider 900 is illustrated that may be utilized as part of themulti-modulus divider 807. Eight clock signals P0-P7 are supplied toselector circuit 901. In the illustrated embodiment, selector circuit901 is implemented as a multiplexer. A three bit control signal 903supplied from register 905 selects which of the clock signals P0 to P7is output by the selector circuit. The clock signals P0-P7 havedifferent phases. By selecting which clock signals are supplied bymultiplexer 901, different frequency clock signals can be generated bythe divider circuit.

Referring to FIG. 10, a timing diagram illustrates operation of thedivider circuit 900. As shown in FIG. 10, the clock signals P0-P7 arederived from the divider input clock 1010. In one embodiment the dividerinput clock 1010 is approximately 2.5 gigahertz and the clock signalsP0-P7 are one fourth of divider input clock signal, approximately 625MHz. Referring again to FIG. 9, the divider circuit 900 selects the nextpulse to be output by adding a value A to the current select signal 903in summing circuit 907 to generate a sum that is supplied to register905. The table below illustrates values of A supplied to summing circuit907 to achieve various divide values.

TABLE 1 Division A(mod 8) A′ (effective A) Factor 1 1 0.5 2 2 1.0 3 31.5 4 4 2.0 5 5 2.5 6 6 3.0 7 7 3.5 0 8 4.0 1 9 4.5 2 10 5.0 3 11 5.5

The use of the divider circuit 900 to generate a clock signal that isdivided down from the divider input clock signal will now be illustratedwith reference to FIG. 10. Assume it is desired to divide the dividerinput clock signal by 2.

Referring to the table above, it can be seen that in order to divide by2 (the division factor), the appropriate value of A is 4. Assume thatthe currently selected clock is P0, so the select signal supplied fromregister 905 will be configured to select P0, e.g., using a value of000. In order to select the next pulse output by the multiplexer, thesumming circuit 407 adds the current value supplied from register 905(which is 000) with the value of A (which is 4) and provides a sum of 4to register 905 to select P4 as the next pulse output by multiplexer901, as illustrated by the clock signal 1020 (Div 2.0) shown in FIG. 10.The sum circuit 907 is implemented as a modulo N summing circuit where Nequals the number of clock signals supplied to multiplexer 401, which is8 in the illustrated embodiment. With 4 as the current value of theselect signals supplied by register 905, the next value supplied as theselect signal is 0, which selects P0 as the next pulse to be output bythe select circuit 901. That is, 4 (the value of the select signal)+4(the value of A)=0 in a modulo 8 summing circuit. A is continually addedto the current select value to generate the next pulse and a sequence ofpulses selected from the phases P0 and P4 is output as shown in FIG. 10to generate an output clock signal that equals divider input clock/2.

A divide by 2.5 will now be described. Assume that the currentlyselected clock is P0, so the select signal on control lines 903 will beconfigured to select P0, e.g., using a value of 000. Referring to Table1, in order to divide by 2.5 (the division factor), the value of A is 5.The summing circuit 907 provides a sum of 5 to register 905 to select P5as the next pulse output by multiplexer 901, as illustrated by the clocksignal 1030 (Div 2.5) shown in FIG. 10. With 5 as the current value ofthe select signals, the next value supplied as the select signal is 2,which selects P2 as the next pulse to be output by the select circuit901. That is, 5 (the value of the select signal)+5 (the value of A)=2 ina modulo 8 summing circuit. A is added to the current select value togenerate the next select value, which is supplied to the select circuit.The next pulse selected is P7.

In the general case, for the circuit shown in FIG. 9, given 8 phases ofa clock, with p(n) being the phase selected at a time “n”, phaseselection is accomplished by p(n+1)=(p(n)+A)mod 8. FIG. 10 also showsthe pulses 540, 550, 560, selected, respectively for divide by 4, 5 and5.5.

Referring to Table 1, note that for the embodiment illustrated in FIG.9, the first three divide values (0.5, 1.0, 1.5) are not available. Alsofor longer divide operations, for example, divide by 4.5, 5, or 5.5, thefirst pulses output in the longer divides need to be ignored. This isillustrated in FIG. 10. Thus, for example, for a divide by 5, andassuming P0 is the initial pulse out, and A=2, the first P2 pulse 1001is ignored but the second P2 pulse is supplied by multiplexer 901.Similarly, after the second P2 pulse 1002 is supplied, the first P4pulse 1003 is ignored. With the first pulse ignored each time, theeffective value of A=9. The resultant waveform 1050 supplied on node 909is labeled Div 5.0 in FIG. 10. Similarly, the initial pulses 1007 and1009 shown in FIG. 10 are ignored in a divide by 5.5 as shown inwaveform 1060.

Referring again to FIG. 9, in order to achieve the necessary delay forthe longer divides, e.g., the divide by 5 and 5.5 shown in FIG. 10, inone embodiment a second selector circuit 921 is utilized with a secondsummer circuit 923 and a second register 925. A skip delay value of 3 isadded to the current select value 903 in summing circuit 923. The skipdelay indicates how many phase steps (each of clocks P0-P7 being a phasestep) should be skipped before the select signal in register 905 isupdated. As shown in FIG. 9, the output clock from multiplexer 901 onnode 909 is used to update register 925 with the sum from summingcircuit 923. The clock selected by multiplexer 921 is used to update theregister 905. That ensures that the value of the select signals do notchange until after the first pulses have been skipped for A equal to 1,2, or 3. For example, if the currently selected clock is P0 and A=1,with a skip count of 3, register 905 is not updated until P3, therebyensuring that the first P1 pulse is skipped. Referring to FIG. 10, askip delay of three ensures that the undesirable pulses 1001, 1003,1007, and 1009 are not output. Note that in some embodiments, themultiplexer 901 may be coupled to receive an input signal that is asteady state input signal, e.g., ground, in addition to the variousphase sets received. In that way, the multiplexer may be selected tooutput no signal.

FIG. 11 illustrates an embodiment of how a multi-modulus divider such asthat illustrated in FIG. 9 may be utilized in the DCO 301 shown in FIG.8. Referring to FIG. 11, a block diagram illustrates a multi-modulusprogrammable divider circuit according to an embodiment of theinvention. The VCO 805 provides an approximately 10 GHz clock signal,which is divided down in dividers 1103 and 1105 to an approximately 2.5GHz clock signal. In order to operate the divider at a high frequencywith low power consumption, some embodiments avoid feeding controlsignals to the high-speed circuitry. Instead, one embodiment utilizes aminimum number of transistors in the high speed portion to save powerand takes advantage of the multiphase output of a divider describedherein to achieve equivalent speed. The programmability is pushed intothe lower frequency circuitry. The 5 GHz signal from node 1103 is fed toa cascade of two dividers, divider 1105, which is a divide-by-two anddivider 1107, which is a divide-by-four phase generator that generates 8different phases. Divider 1107 supplies pulse width controller (PWC)1109, which in turns supplies an 8-to-1 phase selecting multiplexer 1113through flip-flops 1111. The phase selecting multiplexer 1113 directsone of the eight (8) phases from the PWC 1109 to its output. The outputof the multiplexer 1113 is used to clock a divide-by-Q counter (/Q)1117, which generates the divider output. The output is also used totrigger a finite state machine (FSM) 1115, which implements themultiplexer control (phase selection) algorithm, e.g., as illustrated inFIGS. 9-10.

In one embodiment, as illustrated in FIG. 11, the delta sigma modulator809 supplies a stream of integers M′ to block 1119 by to providefractional n divide capability. M′ is a sequence of integers thatapproximates the rational number M. Note that in some embodiments, block1119 may be incorporated into the finite sate machine 1115. Assuming theinput frequency is f_(in) and the output frequency is f_(out), thedivide ratio M=f_(in)/f_(out). In one embodiment M=((9.7 GHz˜11.32GHz)/2)/(10 MHz (Xoxc)˜320 MHz (SAW)) and thus M ranges fromapproximately 15 to approximately 566. In one embodiment the delta sigmamodulator is an eight level quantizer that expands the fractional rangeto M−3 to M+4. The delta sigma modulator may be implemented, e.g., as athird order delta sigma modulator. Given that expansion of thefractional range of M, M ranges from approximately 12 to approximately570. The divider circuit illustrated in FIG. 11 operates fundamentallyas an integer divider with the M′ value updated at a frequency varyingfrom approximately 416 MHz for an M value of 12, to an update frequencyof approximately 9 MHz for an M value of 570.

The operation of the divider described in FIG. 11 can be understood fromthe following arithmetic expression:

$\left. 8 \right)\frac{Q}{M^{\prime}}$ $\frac{{- 8}Q}{R}$

where Q is the quotient and R is the remainder, and M′ is the dividerratio. From that arithmetic expression, the divide ratio M′=8Q+R. Thedivide ratio is thus split into a constant coefficient (here 8, althoughother numbers are of course possible) multiplied by a quotient Q, whichis >=1 and a remainder (R). The R portion is implemented through thephase-selecting multiplexer 1113 being controlled by the finite statemachine (FSM) 1115. Control logic 1119 receives the divide ratio M′,splits it into two portions, a Q number and an R number. The Q number issent to Q divider 1117 input bits, while the R number is used by thefinite state machine 1115. The 8Q value can be understood as a coarsetuning capability, while the R value provides a finer tune capability.

The divide by 8, the constant coefficient, can be accomplished in thehigher speed divide circuits 1105 and 1107. The divide by Q and thedivide by R can be performed in lower speed circuitry. The divide by Qcan be performed in variable divider circuit 1117, which has a muchlower input frequency, thus can be implemented with low speed circuitry.The divide by R can be achieved in the phase selecting multiplexer 1113.The multiplexer 1113 chooses the phase that is R steps offset (R can bepositive or negative) from the last phase in each cycle of the output,thus achieving the division factor 8Q+R. Note that R is similar infunction to A illustrated in FIGS. 9 and 10. By varying both Q and R,flexible programmability is achieved. Various values of R may beutilized examples of which are shown below.

R=(−4, −3, −2, −1, 0, 1, 2, 3) R=(−3, −2, −1, 0, 1, 2, 3, 4), R=(−2, −1,0, 1, 2, 3, 4, 5), R=(−1, 0, 1, 2, 3, 4, 5, 6), R=(0, 1, 2, 3, 4, 5, 6,7)

In each R scheme shown above, there are 8 values corresponding to eachphase step. The R scheme chosen determines the minimum availabledivision ratio and the maximum input frequency at the input of Qcounter. For example, comparing scheme R=(−4, −3, −2, −1, 0, 1, 2, 3) toR=(0, 1, 2, 3, 4, 5, 6, 7), the first scheme can achieve the minimumdivide ratio of /3, while the second one can only achieve the minimumdivide ratio of /8. However the first scheme requires the Q counter tobe able to operate at a much higher frequency. It also imposes tightertiming requirement on multiplexer control signal generation compared toother R scheme. It also consumes more power and may require customdesign of the digital circuitry. Operation of R=(−3, −2, −1, 0, 1, 2, 3,4), is illustrated in FIG. 12.

The top portion of FIG. 12 illustrates the input to the phase selectingmultiplexer 1113, while the bottom portion of FIG. 12 illustrates theoutput for various divide values.

The use of the delta sigma modulator in a fractional N loop isillustrated in the following. Assume for example, that the value of M is100 to achieve a desired nominal output frequency from DCO 301 (FIG. 3).The temperature compensation value determined by the interpolationdescribed above may cause the value of M with temperature compensationto be 100.5. The delta sigma modulator in one embodiment provides anoutput having 8 different integer levels from −3 to 4, to represent thefractional portion, which values are combined with the integer portion(100) and mapped into the dividers of multi-modulus divide by N block807. Thus, values ranging from 97 to 104 may be applied as dividervalues to the multi-modulus divide by N block 807. The use of the deltasigma modulator allows appropriate values to be used to average 100.5.Note that a value is generated by the divide block 807 at a rate of theXO (or other reference) clock frequency supplied on node 800.

Note that noise shaping may be used to place any noise generated in thefeedback divider in a frequency band that may be subsequently filteredby a low pass filter in the loop filter 803. Referring again to FIG. 8,the delta sigma modulator 809 supplies a stream of integers thatapproximates and averages the divide ratio desired. That introducesphase errors that can be compensated by the phase error correction logic861. An embodiment of delta sigma modulator 809 is shown in FIG. 13.Delta sigma modulator receives as the divide control value M=N·f, whereN is the integer portion of M and f is the fractional portion. The phaseerror correction logic 861 generates a phase error correction signal.Additional details on phase error correction can be found in U.S. Pat.No. 7,068,110, entitled “Phase Error Correction,” which patent isincorporated by reference herein.

Referring again to FIG. 8, in another embodiment, the integrated circuitillustrated is coupled as a clock multiplier circuit to multiply thereference signal REF received at divider 335 and to supply themultiplied value as the output of DCO 301. In that embodiment phasedetector and loop filter 337 supply a digital value to multiplexer 853,which in turn is supplied to delta sigma modulator 809. The multipliervalue may be selected by setting the divide values in divide blocks 335and 347. In various embodiments those values may be pin programmable,programmed via a serial port, or predetermined. When being used as aclock multiplier, the outer loop bandwidth is low to minimize jittertransfer from jitter present in the reference signal REF.

FIG. 14 provides a block diagram of an exemplary clock multiplier. Likethe embodiment in FIGS. 3 and 4, FIG. 14 includes an digitallycontrolled oscillator (DCO) 1401, an embodiment of which was describedin relation to FIG. 8. The reference clock to be multiplied is suppliedon one of the clock inputs 1403 (CLKIN_1 to CLKIN_4). In one embodimentinput clocks can range from 2 kHz to 800 MHz range and output clocks canbe generated in the range of 2 kHz to 1.4175 GHz. In one embodiment theinput clocks can hitlessly switch between the input clocksCLKIN_1-CLKIN_4 under either manual or automatic control. Anotherconfiguration supports two high-speed/frame sync clock pairs that can beswitched in tandem. Control logic 1402 selects an appropriate clock tobe output by selector circuit 1405. The selected clock is supplied todivider 1407 and then as a reference to the digital phase detector andloop filter 1409, which compares the reference signal f₃ supplied onnode 1408 to the feedback signal f₂ supplied on node 1410 and generatesan error signal indicative of the difference between the signals. Thefeedback signal f₂ supplied on node 1410 is coupled to the output of DCO1401 through divider 1419. In clock multiplier mode, the control value Mis supplied to the DCO 1401 on node 1412 and is determined based on theerror between the reference signal and the feedback signal. As in FIG.8, the control value M controls the operation of the DCO through itsfeedback divider. In other modes, e.g., wideband mode, the DCO controlvalue M is supplied from the control logic 1402. The DCO can receive asits input clock, either a crystal, SAW or other reference clock input at1413. The external crystal, SAW, or reference clock can be used toimplement a digital hold function and to further improve low-frequencyjitter generation. In digital hold mode an alarm from loss of signal(LOS) and/or optional frequency offset detectors (FOS) causes thedigital control word M existing a programmable amount of time prior tothe alarm to drive the DCO. When the alarm is removed, normal deviceoperation can resume.

In one mode of operation, the input reference clock for the outer loop,i.e., supplied to divider 1407, may also be utilized as the inputreference clock for the DCO 1401 through multiplexer 1415. In oneembodiment there are five differential clock outputs signals 1423(CLKOUT_1 to CLKOUT_5) plus a frame synchronization output 1425. Theoutput of the DCO is supplied to the various output clock signals 1423through output dividers 1420 (NC1-NC5). Note also that the feedback forthe outer loop, in one operational mode supplied through divider 1419 tothe digital phase detector 1409, can alternatively be fed backexternally through one of the clock inputs 1403, e.g., CLKIN_4. Thedivide values of 1407, 1419, and the output dividers 1420 (NC1-NC5) maybe programmed via pins or a communication interface to provide a desiredmultiplication value. A nonvolatile memory may be used to storeconfiguration settings. Other control/communication signals 1406 aresupplied to/from the control logic 1411.

Thus, various embodiments have been described for implementing a clocksource. The description of the invention set forth herein isillustrative, and is not intended to limit the scope of the invention asset forth in the following claims. For example, while a PLL has beendescribed other control loops, such as a frequency locked loop may beutilized to generate appropriate correction/control values to calibratethe oscillator. Other variations and modifications of the embodimentsdisclosed herein, may be made based on the description set forth herein,without departing from the scope of the invention as set forth in thefollowing claims.

1. An integrated circuit comprising: a first phase-locked loop (PLL)circuit including an input for receiving a timing reference signal, acontrollable oscillator circuit providing an oscillator output signal,and a feedback divider circuit; a second phase-locked loop (PLL) circuitconfigured to be selectively coupled to supply a control value to thefeedback divider circuit to thereby control the oscillator outputsignal; a nonvolatile storage; a selector circuit coupled to thenonvolatile storage and the second PLL circuit; wherein while the secondphase-locked loop circuit is not selected by the selector circuit tocontrol the first PLL circuit, the first PLL circuit is coupled toreceive a first control value as the control value to control a divideratio of the feedback divider circuit, the first control value beingdetermined at least in part according to a stored control value storedin the nonvolatile storage, the stored control value corresponding to adesired frequency of the oscillator output signal; and wherein, whilethe second PLL is selected by the selector circuit to supply a secondcontrol value as the control value to the feedback divider circuit, thesecond control value is determined according to a detected differencebetween a feedback signal corresponding to the oscillator output signaland a reference signal coupled to an input of the second PLL circuit. 2.The integrated circuit as recited in claim 1 further comprising: atemperature compensation circuit coupled to supply an adjustment valueaccording to a detected temperature, and wherein the first control valuesupplied as the control value to the feedback divider circuit is furtherdetermined according to the adjustment value.
 3. The integrated circuitas recited in claim 1 further comprising a voltage control input on theintegrated circuit for adjusting a frequency of the oscillator outputsignal and wherein the first control value supplied as the control valueis adjusted according to a voltage value present on the voltage controlinput.
 4. The integrated circuit as recited in claim 1 wherein thestored control value in the non-volatile storage is based on a digitalcontrol value that was stored as a result of the second PLL circuitdetecting a lock condition indicating a signal corresponding to theoscillator output signal was locked to a reference signal coupled to aninput of the second phase-locked loop circuit.
 5. The integrated circuitas recited in claim 1 wherein the second PLL circuit is configured as alow bandwidth phase-locked loop and a bandwidth of the first PLL circuitis substantially higher than the low bandwidth of the control loopcircuit.
 6. The integrated circuit as recited in claim 1 wherein theoscillator output signal is a non-integer multiple of the timingreference signal.
 7. An apparatus comprising: an inner loop circuitincluding a controllable oscillator supplying an inner loop outputsignal; an outer loop circuit; a selector circuit for selectivelycoupling the outer loop circuit to control the inner loop output signal;first means for controlling the inner loop circuit using the outer loopcircuit by supplying a control value from the outer loop circuit tocontrol a divide ratio of a feedback divider of the inner loop circuit,while the outer loop is coupled to control the inner loop circuit, tocause the inner loop to generate the inner loop output signal, at leastin part, according to a reference clock signal supplied to the outerloop circuit; and second means for controlling the inner loop circuitwhile the outer loop circuit is not coupled to control the inner loopcircuit, and wherein the second means for controlling is responsive to astored control value to control the feedback divider.
 8. The apparatusas recited in claim 7 further comprising: means for adjusting the innerloop output signal according to a detected temperature.
 9. The apparatusas recited in claim 7 further comprising means for providing adjustingthe inner loop output signal according to a voltage on a voltage controlinput.
 10. An integrated circuit comprising: a first phase-locked loopcircuit including, an input for receiving a timing reference signal, afeedback divider circuit, and a controllable oscillator circuit; asecond phase-locked loop circuit coupled to compare a feedback signalcoupled to an output of the controllable oscillator circuit and areference signal coupled to an input of the second phase-locked loopcircuit, and to generate an error signal indicative of the comparison;wherein the second phase-locked loop circuit is coupled to supply adivider control signal to control a divide ratio of the feedback dividercircuit, the divider control signal being determined at least in partaccording to the error signal generated by the second phase-locked loopcircuit; and wherein the second phase-locked loop circuit has abandwidth substantially lower than a bandwidth of the first phase-lockedloop circuit.
 11. The integrated circuit as recited in claim 10 whereinthe bandwidth of the second PLL circuit is less than or equal toapproximately 1 KHz and the bandwidth of the first PLL circuit isbetween approximately 10 KHz and 10 MHz.
 12. The integrated circuit asrecited in claim 10 wherein the feedback signal for the secondphase-locked loop circuit is fed back to the second phase-locked loopthrough an input to the integrated circuit.